Scanning Electron Microscope will boost turnaround at Stork TCT
ST. PAUL, MN - October 6, 2008
Stork TCT recently announced the acquisition of a Hitachi S-3500N Variable Pressure Scanning Electron Microscope (SEM) with Oxford EDS system. The advanced instrument features a variable pressure vacuum system, secondary and Robinson backscatter detectors, an Oxford EDS system with INCA software, 3-axis motorized specimen stage with size 100mm by 50mm, and accelerating voltages from 0.3 to 30 kV, all significant upgrades to the previous SEM capabilities.
Stork TCT Failure Analyst Andrew Theisen said, "The SEM extends our in-house capabilities to evaluate metallic and nonmetalic samples for chemical and failure analysis. It allows visual characterization at high magnifications with the capability to conduct qualitative chemical analysis. This is a greatly useful piece of equipment that provides highly detailed and valuable information about materials. I'm excited to be working with it."
The Hitachi SEM is installed and fully operational. Participants in the recent Stork TCT seminar, "Introduction to Failure Prevention," observed the machine in operation during tours after the presentation.
Services enabled by the Scanning Electron Microscope:
- Failure Analysis (Fractography, Surface Chemical Analysis, Contamination Analysis)
- Coating Thickness and other measurements
- Visual Surface Roughness Comparisons
- Inorganic and organic sample analysis
- Semi-Quantitative chemical analysis using EDS
- Backscatter Imaging can identify the elemental composition differences
- High resolution photography
For more information about materials testing at Stork TCT, contact info.tct@stork.com. Free technical articles and white papers on failure analysis and other testing capabilities
are available for downloading on the Stork website Information Center.